Semiconductor companies are racing to develop AI-specific chips to meet the rapidly growing compute requirements for artificial intelligence (AI) systems. AI chips from companies like Graphcore and ...
Many IC designers finally have embraced design for testability (DFT) in the form of scan insertion for digital circuit designs because of the significant time-to-production advantages these techniques ...
When existing advanced 2D designs already push the limits of design-for-test (DFT) tools, what hope do developers have of managing DFT for 3D devices? Can anyone afford the tool run time, on-chip area ...
In today’s fast growing Systems-on-Chip (SoC), incomplete or ineffective DFT support due to poor specification or loose design practices can quickly become the critical path to making market windows ...
Why isolated flows negatively impact design schedule and PPA. Benefits of unified DFT, synthesis, and physical design flows. Physical implementation optimization methods for test compression and scan ...
Nowadays, placing multiple IPs on a single chip plays the most vital role in satisfying System on Chip ASIC specification requirements. Most of the time, these different IPs will have different clock ...
To achieve higher quality on today's multimillion-gate designs and high-speed ASICs, structured DFT (design-for-test) methodologies such as scan, at-speed test, scan compression, and BIST (built-in ...
STOCK batch type retorts / autoclaves and plants are the focus of dft technology’s product range. Controls, documentation and SCADA systems represent perfectly balanced components, which are also ...
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