Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.

On the 24th of last month at the inspection room of Shinhadaiamond Industry’s first factory in Namdong-gu, Incheon, 12 ...

TSMC claims its upcoming N2 manufacturing node is ahead of schedule on defect reduction, even though it is the company’s first attempt at gate-all-around (GAA) nanosheet transistor technology.

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

We heard that new facilities see “low output” and higher “defect rates” regardless of their geography. Image: Clean Energy Associates. New solar manufacturing facilities show higher rates of product ...