With the increasing complexity in design in the semiconductor industry and advanced lower technology nodes, it is important as a DFT architecture design and service engineer to signoff the chip with ...
Many digital-communications systems use non-return-to-zero (NRZ) signaling, and system designers have created many NRZ test patterns to test and verify their products. These patterns usually either ...
[Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one is checking ...
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