Diagnostic test developers, including clinical laboratories, responded to the COVID-19 pandemic with inspiring creativity to meet patient testing needs. These developers found unique ways to enable ...

My colleagues from Mentor Graphics, Ron Press, Martin Keim, and I often write about various aspects of digital IC test. If you started following the Test Voices blog when it was part of Test & ...

Left-shifting DFT, scalable tests from manufacturing to the field, enabling system-level tests for in-field debug.

The importance of properly integrating test points into a PCB design. Test-point deployment considerations. When it comes to creating a modern electronic design, we live in both the best and the worst ...

Logic built-in self-test (LBIST), is a mechanism that lets an (IC) test the integrity of its own digital logic structures. LBIST operates by stimulating the logic-based operations of the IC and then ...

The exponential growth in design sizes has rendered the traditional methods of design-for-test, layout, and timing closure no longer sufficient. Design and test engineers not only have to constantly ...

Getting an integrated circuit (IC) from design to test is an arduous process that encompasses a number of steps, including: This is an iterative process and can take months, so every step should be ...

Jerry Cao is a content strategist at UXPin — a wireframing and prototyping app with built-in usability testing — where he develops in-app and online content for the wireframing and prototyping ...